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High speed Radiation detection using MODFET semiconductor devices


Stanford Reference:

10-154


Abstract


Stanford researchers have developed a novel radiation detection technology using a well-known class of high-speed transistor technology called a high electron mobility transistor (HEMT). The invention comprises super high-speed (50GHz) bandwidth particle detection in a 2-D array, high signal-to-noise ratio, and the ability to measure energy for each incoming particle. A main application for the concept is in X-ray imaging applications, such as X-ray CT, digital mammography systems. The concept enables counting of each individual X-ray photon while simultaneously analyzing its energy. This cannot be achieved in the same manner by currently available x-ray detectors. Importantly, with the increase in signal-to-noise ratio, physicians can considerably reduce the radioactive dose given to patients without sacrificing the image quality of the scan. This technology is enabled by 2-D arrays of ultra-fast HEMT/PHEMT semiconductor detectors.

Applications


  • X-ray CT imaging
  • Planar X-ray imaging
  • Beta detection and autoradiography

Advantages


  • Capable of extremely high photon counting rates
  • Counts photons and determines photon energy using high direct detection semiconductors
  • Provides high signal-to-noise ratio
  • Reduces patient radioactive dosage
  • Utilizes currently available high speed transistor technology

Publications



Innovators & Portfolio



Patent Status



Date Released

 6/5/2014
 

Licensing Contact


Irit Gal, Senior Licensing Associate
650-723-1586 (Business)
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Related Keywords


radiography   particle detection   high energy photon detection   healthcare: X-Ray   diagnostic: detection   single photon emission computed tomography   semiconductor: optical   semiconductor: devices   healthcare: imaging   healthcare: CT scanning   diagnostic: imaging   Scintillation Detectors   x-ray detection   imaging: CT   imaging: x-ray   10-154   
 

   

  

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