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High Bandwidth Atomic Force Microscopy for Nanomechanical Studies


Stanford Reference:

12-419


Abstract


Engineers in Prof. Olav Solgaard's laboratory have developed a high bandwidth atomic force microscopy (AFM) probe capable of high speed, high resolution quantitative mapping of the physical properties of biological cells and other materials in air or in fluid. This technology utilizes interdigitated AFM probes with a high bandwidth diffraction grating force sensor to measure interaction forces between the probe tip and the sample surface. This probe and signal processing system enables fast AFM-based analysis with insight into the physical properties of the sample that cannot be achieved with traditional techniques.

Stage of Research
The inventors have used this AFM probe to image a wide range of samples in fluid, including producing indentation dependent images of biological cells (demonstrating the ability to image subsurface structures of materials).


Applications


  • Atomic Force Microscopy extended to analysis of mechanical properties for range of materials, such as:
    • cells and other live biological materials (e.g. stiffness mapping)
    • polymers
    • inorganic materials
  • Nanomechanical studies of structures and forces such as Young’s modulus, hardness, surface topography and energy, electrical potential, electric/magnetic field, resistance/capacitance, and adhesive forces

Advantages


  • High bandwidth
  • High speed - enables mapping of live cells and other materials that must be imaged quickly
  • High resolution - nanoscale measurements of mechanical properties with better sensitivity to higher frequency components of tip-sample interaction force than traditional AFM probes
  • Flexible operating conditions:
    • probe is designed to function in air or in fluid (with varying optical properties such as refractive index)
    • variety of operating conditions (varying wavelengths and incident angles of light source)
  • Simple fabrication with industry standard (MEMS) batch processes and equipment

Publications



Related Web Links



Innovators & Portfolio



Patent Status



Date Released

 9/26/2013
 

Licensing Contact


Grace Yee, Licensing Associate
650-723-8510 (Business)
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Related Keywords


instrumentation: atomic probe microscopy   instrumentation: microscopy   AFM   AFM/SPM   Atomic Force Microscopy   atomic probe microscopy   imaging probe   scanning probe microscopy   
 

   

  

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