Docket #: S17-348
Multi-pass electron microscopy for enhanced imaging
Stanford researchers at the Kasevich Lab have prototyped a multi-pass electron microscope that can image nanometer scale samples including electron damage sensitive proteins and other electron dose sensitive nanostructures with low damage. The multi-pass protocol allows imaging of these objects with doses below the levels which currently damage or destroy the imaging target (?10e?/𔮰).
This type of imaging is not possible with current electron microscopy methods since either the electron dose will damage the specimen or resolution will not be sufficient. This microscope enables order-of-magnitude improvement in dose-limited resolution, or a ten-fold reduction in sample damage at equivalent resolution. In addition, the column design reduces aberration which is a limitation for multi-pass configurations.
Related Technologies from Kasevich Group:
S15-188: Multi-pass microscopy for high sensitivity, low damage microscopy"
Patent Application: 20170261739
Stage of Research
- Proof-of-concept laboratory demonstration using prototype
Applications
- Imaging applications in structural biology, material science, and pharmaceutical research
- Low damage imaging of nm scale proteins, DNA, nanostructures and other entities
Advantages
- Novel - this method enables imaging of proteins previously considered unimageable with existing electron microscopy methods
- Low damage - ten-fold reduction in sample damage at equivalent resolution
- Higher resolution - order-of-magnitude improvement in dose-limited resolution
- Produces higher quality images compared to standard microscopy
- Reduces aberration using aberration corrected gated mirrors which is an issue with multi-pass microscopy
- Can apply various modalities including dark-field (MP/DF), scanning (MP/STEM) and energy loss (MP/EELS)
Publications
- Thomas Juffmann, Brannon B. Klopfer, Timmo L.I. Frankort, Philipp Haslinger & Mark A. Kasevich. "Multi-pass microscopy." Nature Communications 7, Article number: 12858 (2016).
- Kubota, Taylor. "Stanford physicists develop a more sensitive microscope." Stanford News (Sept. 27, 2016)
Related Links
Patents
- Issued: 11,456,148 (USA)
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