S13-388 Fast Quick Error Detection (Fast QED) Tests Stanford researchers have developed new Fast Quick Error Detection (Fast QED) tests that are four orders of magnitude faster than standard QED tests while also preserving quick error detection properties. Hai Lin Subhasish Mitra
S09-055 High Fidelity, Radiation Tolerant Analog-to-Digital Converter Stanford researchers have patented a radiation-tolerant, pipeline analog-to-digital converter (ADC) in a fully commercial CMOS technology. Charles Wang Ivan Linscott Umran Inan