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High Resolution Capacitance Bridge for Nano-structures


Stanford Reference:

11-133


Abstract


This technology is an Integrated Capacitance Bridge (ICB) that can perform ultra-high-resolution (aF), wide-temperature-range measurements of capacitance in nano-structures. The ICB has an operational range of 4K-300K and can measure at length scales 100x smaller than the current standard equipment. The ICB also uses a small excitation signal so that it can probe the electronic details of nano-scale structures without disturbing them. It can be used either as a stand-alone chip or integrated into a probe device for quality testing, measurement, or characterization of new and existing materials such as carbon nanotubes and graphene.

Stage of Research
The inventors have fabricated the ICB and tested it on top-gated graphene devices, exceeding the resolution of a commercially available capacitance bridge by several orders of magnitude.

Applications


  • Nanoscale testing and measurement of capacitance spectrum for nano-structures or materials that exhibit quantum capacitance, including:
    • characterizing new research materials (such as carbon nanotubes and graphene) in computing devices and memory
    • quality testing existing materials

Advantages


  • Ultra high-resolution:
    • 60aF/rt(Hz) (orders of magnitude better than commercially available equipment)
    • data are not distorted by the large contact resistance that often exists at the interfaces of nano-scale devices
  • Wide-temperature range - 4K-300K
  • Small excitation signal:
    • signal amplitude smaller than kBT/q (compared to 10's of millivolts in current equipment)
    • can probe nano-devices without disturbing them

Publications



Related Web Links



Innovators & Portfolio



Date Released

 6/16/2011
 

Licensing Contact


Evan Elder, Licensing Associate
eelder@stanford.edu
650-725-9558 (Mobile)

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Related Keywords


nanotechnology   attofarad capacitance measurement   nano-structure   nanoelectronics   capacitance measurement    quantum capacitance    materials: thin film   materials: superconductor   materials: storage   materials: carbon nanotubes   semiconductor: testing & analysis   wide-temperature range capacitance measurement   Capacitance   computer memory   material testing   materials analysis   memory devices   scanning probe device   semiconductor: embedded memory   semiconductor: memories   testing & analysis   semiconductor equipment   materials   semiconductor   
 

   

  

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