Docket #: S16-173
Fates - Compact, Sensitive X-ray Differential Phase Contrast Imaging System
Researchers in Prof. Lambertus Hesselink's laboratory have developed a compact, sensitive X-ray differential phase contrast (DPC) imaging system that improves field of view, increases fringe visibility and shortens imaging times. This technology, called Fates, replaces the standard 3-grating system architecture with a single grating that is combined with a specialized, patterned x-ray source (PexSA - described in Stanford Docket S12-318) and x-ray detector (PcXDa – described in Stanford Docket S15-291). By eliminating two expensive grating components, the overall size and potential cost of the system is reduced. Furthermore, this configuration enables a single-step image acquisition with a field-of-view of approximately 35 degrees and fringe contrast approaching 50%. This technology could allow users to distinguish between hazardous and non-hazardous materials in baggage inspection applications or to identify tumors in medical imaging applications.
Stage of Research
The inventors are building a prototype Fates system with preliminary results in the following applications:
- Aviation security – improved object identification (see figure)
- Medical imaging – improved detection and imaging of soft tissue density and tumors

DPC at 40keV reveals liquids and powders in cluttered carry-on bag environment
Applications
- Industrial X-ray inspection:
- baggage and container inspection for homeland security
- non-destructive testing
- Medical imaging
Advantages
- Compact - this DPC system is smaller because it has fewer components (one grating instead of the three gratings typically found in DPC systems)
- Sensitive:
- field of view typically exceeds 35 degrees (compared to a few degrees for a standard DPC system)
- fringe contrast approaches 50% (2-3x improvement over conventional DPC systems)
- users can distinguish between hazardous and non-hazardous materials based on refractive indexes
- Fast:
- single step data acquisition
- enhanced visibility from the x-ray source and detector eliminates the need for long image acquisition
- Reduced cost - eliminates two high-aspect ratio amplitude gratings which are relatively difficult and expensive to fabricate
Patents
- Published Application: 20170307549
- Issued: 10,859,517 (USA)
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