S17-348 Multi-pass electron microscopy for enhanced imaging Stanford researchers at the Kasevich Lab have prototyped a multi-pass electron microscope that can image nanometer scale samples including electron damage sensitive proteins and other electron dose sensitive nanostructures with low damage. Mark Kasevich Stewart Koppell Brannon Klopfer Thomas Juffmann Marian Mankos
S15-188 Multi-pass microscopy for high sensitivity, low damage microscopy Stanford researchers have developed a microscope system that generates high-quality images in low-light conditions, and preserves delicate samples. Brannon Klopfer Mark Kasevich Thomas Juffmann Philipp Haslinger