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Docket #: S14-086

Nanoscale optical tomography with cathodoluminescence spectroscopy

Stanford researchers have developed a novel tomographic technique, cathodoluminescence (CL) spectroscopic tomography, to probe optical properties in 3D with nanometer-scale spatial and spectral resolution. These tomograms can locate regions of efficient cathodoluminescence across visible and near- infrared wavelengths in three dimensions, with contributions from material luminescence and radiative decay of electromagnetic eigenmodes.
This CL tomography technique has been demonstrated by reconstructing a 3D metal-dielectric metamaterial resonator, illustrating how the technique can be applied to almost any materials system to achieve label-free, nanoscale 3D visualization of light-matter interactions.

Figure


Figure description - SEM CL Set-up

Stage of Research

  • Proof-of-concept – Successfully demonstrated use of CL tomography to achieve nanoscale 3D visualization of light–matter interactions by reconstructing a three-dimensional metal–dielectric nanoresonator
  • Applications

    • Photovoltaics, may enable determination of the 3D distribution of defect states
    • Light emitting diodes or other semiconductor-based devices, will allow 3D visualization of radiative recombination centers
    • Bio-imaging, may enable label-free 3D imaging of nanostructures
    • Quantum computing

    Advantages

    • 3D Imaging - Image radiative optical properties with nanoscale spatial and spectral resolution in 3D
    • High resolution afforded by cathodoluminescence combined with 3D imaging capabilities enabled by tomographic reconstruction
    • Resolution at least 10-100 times better than the diffraction limit
    • Simple computational methods for reconstruction
    • Does not require labels (i.e. fluorescent molecules used in conventional super-resolution biological imaging)
    • Improvements over STEM EELS tomography:
      • Signal is fundamentally different/complementary
      • Higher spectral resolution
      • SEM -> wider range of samples, cheaper instrumentation

    Publications

    Patents