We present a revolutionary advancement in ferroelectric materials that is set to redefine the landscape of embedded memories and semiconductor technologies.
As part of a comprehensive optofluidic platform, researchers at Stanford have developed an integrated dynamic flat-optics system enabling microlens-free metasurface planar light-field displays.
Stanford researchers in the Brongersma Lab have developed an integrated dynamic flat-optics system as part of a comprehensive optofluidic platform, enabling unprecedented compact configurations.
As part of a comprehensive optofluidic platform, researchers at Stanford have developed a new type of reflective display technology for achieving transparent displays, which allow users to receive visual information from the external world through the display at the same time.
Researchers at Stanford have advanced the concept of an "Anticipatory Control Interface" that informs the driver of a partially automated vehicle of its lateral trajectory plan.
The Zhenan Bao Research Group at Stanford University developed and manufactured a photo-curable, directly patternable, stretchable, and highly conductive polymer that is ideal for bioelectronic applications, and stretchable electronic devices.
Scientists in the Zhenan Bao Research Group at Stanford developed a process for direct photo-patterning of electronic polymers that improves device density of elastic circuits over 100x.
The Zhenan Bao Research Group at Stanford University has designed an intrinsically stretchable polymeric matrix that allows seamless integration with physically crosslinked PEDOT:PSS, while stabilizing its high stretchability, and high conductivity after all necessary fabricat
The Foundational QED embodies a set of source code files for performing the basic EDDI, CFCSS, and CFTSS QED transformations for creating tests with extremely short error detection latencies and high error detection coverage.
Stanford researchers have developed new Fast Quick Error Detection (Fast QED) tests that are four orders of magnitude faster than standard QED tests while also preserving quick error detection properties.
During post-silicon validation and debug, manufactured integrated circuits (ICs) are tested in actual system environments to detect and fix design flaws (bugs). Existing techniques are costly due to ad hoc, manual methods.