The Foundational QED embodies a set of source code files for performing the basic EDDI, CFCSS, and CFTSS QED transformations for creating tests with extremely short error detection latencies and high error detection coverage.
Stanford researchers have developed new Fast Quick Error Detection (Fast QED) tests that are four orders of magnitude faster than standard QED tests while also preserving quick error detection properties.
Stanford researchers have developed new Fast Quick Error Detection (Fast QED) tests that are four orders of magnitude faster than standard QED tests while also preserving quick error detection properties.
During post-silicon validation and debug, manufactured integrated circuits (ICs) are tested in actual system environments to detect and fix design flaws (bugs). Existing techniques are costly due to ad hoc, manual methods.
Researchers in the Robust Systems Group at Stanford University developed a method for dividing the available resistance window in a multi-bit per cell Resistive RAM into varying resistance distributions to improve read and program performance.