During post-silicon validation and debug, manufactured integrated circuits (ICs) are tested in actual system environments to detect and fix design flaws (bugs). Existing techniques are costly due to ad hoc, manual methods.
Stanford researchers have patented an image sensor that overcomes frame rate and power consumption limits for high-speed mega-pixel imaging, and therefore can extend battery life for mobile phone cameras.
Stanford researchers have developed a new technology to create a programmable yet low power processing core targeting imaging systems. This core is built around a 2D-stencil processing data-path.